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Cal Quality has decades of testing experience. We can provide yield
analysis and test-process optimization, including
combined in-circuit and functional examination for
improved test coverage.
- In-Circuit Testing
- J-Tag Testing
- AOI (Automated Optical Testing)
- Functional Test
- Board Level
- Sub Assembly Level
- System Level
- RF
- BGA and Micro BGA X-Ray Inspection
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Our test systems are designed to provide the
highest possible level of reliability.
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