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Testing


Cal Quality has decades of testing experience. We can provide yield analysis and test-process optimization, including combined in-circuit and functional examination for improved test coverage.

  • In-Circuit Testing
  • J-Tag Testing
    • Flying Probe Test System
  • AOI (Automated Optical Testing)
  • Functional Test
    • Board Level
    • Sub Assembly Level
    • System Level
    • RF
    • BGA and Micro BGA X-Ray Inspection

 

 


Our test systems are designed to provide the highest possible level of reliability.